H. Bax

发表

Quantitative RBS analysis using RUMP. On the accuracy of the He stopping in Si

A. Climent-Font, U. Wätjen, H. Bax, 1992 .

Investigation of the fission fragment properties of the reaction 238U(n,f) at incident neutron energies up to 5.8 MeV

F. Hambsch, S. Oberstedt, F. Vives, 2000 .

Discrimination of pile up in a fission fragment detection experiment

F. Hambsch, L. Demattè, H. Bax, 2002 .

Fisson Fragment Properties and the Problem of The Pulse Height Defect

F. Hambsch, S. Oberstedt, F. Tovesson, 2002 .

On the complementary use of ion beam techniques in the near surface analysis of implanted alloys

J. Räisänen, H. Bax, Uwe Wätjen, 1996 .

A set of standards for an investigation into the accuracy of PIXE analysis in a case of strong peak interferen

P. Rietveld, U. Wätjen, H. Bax, 1993 .

Evaporated and implanted reference layers for calibration in surface analysis

U. Wätjen, P. Rietveld, H. Bax, 1992 .

Bi-implanted silicon reference material revisited: uniformity of the remaining batch

U. Wätjen, H. Bax, 1994 .