Berk Morkoç

Post-deposition annealing effect on the structural and electrical properties of ytterbium oxide as an alternative gate dielectric

E. Yilmaz, A. Kahraman, Berk Morkoç, 2022, Materials Chemistry and Physics.

The relationship between structural and electrical properties of the post-deposition annealed Er2O3/n-Si hetero-structures

E. Yilmaz, A. Kahraman, Berk Morkoç, 2021 .

Effects of the oxide/interface traps on the electrical characteristics in Al/Yb2O3/SiO2/n-Si/Al MOS capacitors

E. Yilmaz, A. Kahraman, Berk Morkoç, 2021, Journal of Materials Science: Materials in Electronics.

Electrical Parameters of the Erbium Oxide MOS Capacitor for Different Frequencies

E. Yilmaz, A. Kahraman, A. Aktağ, 2019, Celal Bayar Üniversitesi Fen Bilimleri Dergisi.

IRRADIATION EFFECT ON Er 2 O 3 /n-Si STRUCTURE UNDER HIGH GAMMA-RAY DOSE

A. Kahraman, U. Gurer, Alex Mutale, 2020 .