Sabine Holzer

Measuring Sodium Migration in Mold Compounds Using a Sodium Amalgam Electrode as an Infinite Source

M. Nelhiebel, P. Weinberger, A. Limbeck, 2017, 2017 IEEE 67th Electronic Components and Technology Conference (ECTC).

Large O2 Cluster Ions as Sputter Beam for ToF-SIMS Depth Profiling of Alkali Metals in Thin SiO2 Films.

J. Zakel, H. Hutter, Stefan Krivec, 2017, Analytical chemistry.