Wim C. Sinke

Point defect populations in amorphous and crystalline silicon

J. Poate, D. Eaglesham, D. Jacobson, 1990 .

Structural relaxation in amorphous silicon and the role of network defects

A. Polman, J. Poate, D. Jacobson, 1991 .

Influence of layer thickness on nucleation in amorphous silicon thin films

W. Sinke, S. Roorda, A. Gorkum, 1990 .

Transient structural relaxation of amorphous silicon

T. Warabisako, W. Sinke, M. Miyao, 1988 .

The structure of nanocrystalline silicon formed by laser-induced explosive crystallization

T. Warabisako, W. Sinke, M. Miyao, 1989 .

Structural Relaxation of Amorphous Silicon Induced by High Temperature Annealing

W. F. V. D. Weg, W. Sinke, F. Saris, 1990 .