Xiaoyue Yang

发表

Structural characterization of multilayer using the analysis combining GIXRF with GIXRR method

Zhanshan Wang, Jingtao Zhu, Xiaolong Li, 2013, Other Conferences.

Ni layer thickness dependence of the interface structures for Ti/Ni/Ti trilayer studied by X-ray standing waves.

Zhanshan Wang, Jingtao Zhu, Haochuan Li, 2013, ACS applied materials & interfaces.