Safak Sayan

Thermal decomposition behavior of the HfO2/SiO2/Si system

G. Wilk, E. Garfunkel, T. Gustafsson, 2003 .

Effect of nitrogen on band alignment in HfSiON gate dielectrics

Luigi Colombo, Serdar Sayan, Igor Levin, 2005 .

Hafnium oxide gate dielectrics grown from an alkoxide precursor: structure and defects

Y. Chabal, T. Emge, E. Garfunkel, 2004 .