W. Dua

The two dimensional microstructure characterization of cemented carbides with an automatic image analysis process

Chen Jian, Qingyun Dai, Chen Shaohua, 2017 .

Electrical characterization and conduction mechanism of impurity-doped BaSi 2 films grown on Si ( 111 ) by molecular beam epitaxy

M. Babaa, K. Nakamuraa, T. Saitoa, 2012 .