T. Doust

发表

Competing processes and controlling energies at the Ag/Si(111) interface

J. Venables, G. Raynerd, T. Doust, 1992 .

Surface Diffusion and Nucleation Processes in Thin Film Formation: The Case of Ag/Si(111)

J. Venables, R. Kariotis, T. Doust, 1987 .

LEED investigation and analysis of Pb/Si(111)

S. Tear, T. Doust, 1991 .

Studies of Surface Diffusion and Crystal Growth by SEM and STEM

J. Venables, M. Krishnamurthy, J. Drucker, 1990 .

Sem observations of Ag surface diffusion at the Si(111)√3-Ag interface

J. Venables, O. Osasona, G. Lay, 1986 .

Nucleation and Growth Mechanisms in Hetero-Epitaxial Films

J. Venables, M. Krishnamurthy, J. Drucker, 1990 .

Biassed secondary electron imaging studies of Ag/Si(111)

J. Venables, F. L. Metcalfe, T. Doust, 1989 .

STM studies of the RT Pb-Si(111) interface structure

S. Tear, M. Hadley, T. Doust, 1991 .

A low-energy electron diffraction analysis of the structure of the titanium dioxide (001) surface

G. Thornton, S. Tear, C. G. Mason, 1991 .