G. England

Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope.

A. Wilkinson, P. Parbrook, B. Hourahine, 2012, Physical review letters.

Imaging and identifying defects in nitride semiconductor thin films using a scanning electron microscope

M. Tordjman, P. Parbrook, B. Hourahine, 2012 .

Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films

P. Parbrook, B. Hourahine, A. Day, 2012, Microscopy and Microanalysis.

The effect of density ratio on the near field of a naturally occurring oscillating jet

P. Kalt, R. Kelso, G. Nathan, 2010 .