G. Stingeder

Characterization of thin-film electroluminescent structures by SIMS and other analytical techniques

M. Grasserbauer, L. Niinistö, M. Leskelä, 1985 .

Quantitative distribution analysis of dopant elements in silicon with SIMS for the improvement of process modelling

R. Tielert, Manfred Grasserbauer, E. Guerrero, 1983 .

Quantitative characterization of surface layers on corroded medieval window glass with SIMS

G. Stingeder, M. Grasserbauer, M. Schreiner, 1984 .

Investigation of surface reactions of metals by quantitative distribution analysis with SIMS

Manfred Grasserbauer, Manfred Schreiner, M. Schreiner, 1984 .

Imaging SIMS for the investigation of substrate surfaces for CVD diamond deposition

R. Steiner, R. Haubner, B. Lux, 1995 .