Yukiya Miura

发表

Yukiya Miura, Yousuke Miyake, Seiji Kajihara, 2014, 2014 IEEE 23rd Asian Test Symposium.
Yukiya Miura, Miyuki Inoue, Yuya Kinoshita, 2019, 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS).
Kozo Kinoshita, Yukiya Miura, K. Kinoshita, 1992, Proceedings International Test Conference 1992.
Yukiya Miura, 2004, 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings..
Koji Nii, Hidetoshi Onodera, Toshinori Sato, 2019 .
Kazumi Hatayama, Tomokazu Yoneda, Yukiya Miura, 2019 .
Yutaka Hata, Masaki Hashizume, Hiroyuki Yotsuyanagi, 2011, 2011 11th International Symposium on Communications & Information Technologies (ISCIT).
Kozo Kinoshita, Yukiya Miura, Arabi Keshk, 2000, Proceedings of the Ninth Asian Test Symposium.
Yutaka Hata, Masaki Hashizume, Hiroyuki Yotsuyanagi, 2007 .
Yukiya Miura, Jiro Kato, 2008, 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems.
Yukiya Miura, 1995, Proceedings of 1995 IEEE International Test Conference (ITC).
Yukiya Miura, 2008, IEICE Trans. Inf. Syst..
Kozo Kinoshita, Yukiya Miura, Yasushi Wada, 1993, Systems and Computers in Japan.
Yukiya Miura, S. Naito, 1994, Proceedings of IEEE 3rd Asian Test Symposium (ATS).
Yukiya Miura, Takuya Yamamoto, 2017, 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS).
Motoyuki Sato, Kotaro Shimamura, Kazumi Hatayama, 2012, 2012 IEEE International Test Conference.
Arabi Keshk, Kozo Kinoshita, Yukiya Miura, 1999, Proceedings Eighth Asian Test Symposium (ATS'99).
Yukiya Miura, Jiro Kato, 2006, 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.
Xiaoqing Wen, Kohei Miyase, Yukiya Miura, 2010, 2010 15th IEEE European Test Symposium.
Yukiya Miura, Yoshihiro Ohkawa, 2014, 2014 IEEE 20th International On-Line Testing Symposium (IOLTS).
Arabi Keshk, Kozo Kinoshita, Yukiya Miura, 1999, Proceedings Eighth Asian Test Symposium (ATS'99).
Hideo Tamamoto, Yukiya Miura, Yuichi Narita, 1988, Systems and Computers in Japan.
Yuichiro Shibata, Makoto Ikeda, Hiroyuki Tomiyama, 2014 .
Yukiya Miura, Yousuke Miyake, Seiji Kajihara, 2012, 2012 17th IEEE European Test Symposium (ETS).
Yukiya Miura, 2007, 2007 IEEE International Test Conference.
Hiroshi Yamazaki, Yukiya Miura, 1999, J. Electron. Test..
Kozo Kinoshita, Yukiya Miura, Sachio Naito, 1994, Proceedings of IEEE International Symposium on Circuits and Systems - ISCAS '94.
Kozo Kinoshita, Masaki Hashizume, Hiroyuki Yotsuyanagi, 2003 .
Hideo Tamamoto, Yukiya Miura, Yuichi Narita, 1987, Systems and Computers in Japan.
Yukiya Miura, Yuya Kinoshita, 2020, 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS).
Yukiya Miura, Daisuke Kato, 2003, Proceedings 18th IEEE Symposium on Defect and Fault Tolerance in VLSI Systems.
Yukiya Miura, Tatsunori Ikeda, 2015, 2015 20th IEEE European Test Symposium (ETS).
Yukiya Miura, 1996, IEEE Des. Test Comput..
Yukiya Miura, Sachio Naito, 1995, IEICE Trans. Inf. Syst..
Kozo Kinoshita, Masaki Hashizume, Hiroyuki Yotsuyanagi, 2001, Proceedings 10th Asian Test Symposium.
Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2006, Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06).
Kozo Kinoshita, Masaki Hashizume, Takeomi Tamesada, 1998, Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259).
Yukiya Miura, Shuichi Seno, 2001, IEEE European Test Workshop, 2001..
Haruo Kobayashi, Yukiya Miura, Seiji Kajihara, 2020, 2020 IEEE 38th VLSI Test Symposium (VTS).
Kozo Kinoshita, Masaki Hashizume, Hiroyuki Yotsuyanagi, 2002 .
Yukiya Miura, Seiji Kajihara, Yousuke Miyake, 2020, 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS).
Tomokazu Yoneda, Yukiya Miura, Satoshi Ohtake, 2009, 2009 IEEE 8th International Conference on ASIC.
Yukiya Miura, Y. Miura, 1997, Proceedings International Test Conference 1997.
Yukiya Miura, 2011, 2011 Sixteenth IEEE European Test Symposium.
Yukiya Miura, Yousuke Miyake, Seiji Kajihara, 2016, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Kozo Kinoshita, Masaki Hashizume, Hiroyuki Yotsuyanagi, 2003, 2003 Test Symposium.
Yukiya Miura, Yoshihiro Ohkawa, 2012, 2012 IEEE 21st Asian Test Symposium.
Yukiya Miura, Yousuke Miyake, Seiji Kajihara, 2014, 2014 IEEE 23rd Asian Test Symposium.
Yutaka Hata, Masaki Hashizume, Hiroyuki Yotsuyanagi, 2008 .
Yukiya Miura, 2005, 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05).
Yukiya Miura, Shingo Tsutsumi, 2021, 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS).