L. Borowicz

Photoelectronic measurement methods and the universal measurement system for precise parameter determination of semiconductor structures

P. Machalica, S. Porębski, J. Zając, 2002 .

Universal system for photoelectric characterisation of semiconductor structures

P. Machalica, S. Porębski, L. Borowicz, 2003 .

Wielozadaniowy system do badań fotoelektrycznych struktur półprzewodnikowych (WSBF)

P. Machalica, S. Porębski, J. Zając, 2001 .

Determination of the optical properties of thin absorbing layers with spectroscopic ellipsometry and interferometric microscopy

L. Borowicz, A. Kudla, A. Kudła, 2005, SPIE Optical Metrology.

A photoelectric method to determine lateral distribution of the effective contact potential difference in MOS structures

L. Borowicz, A. Kudla, H.M. Przewlocki, 2004, Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510).