Claude Cirba

A non-iterative physical procedure for RF CMOS compact model extraction using BSIM6

Xin Zhang, Ali M. Niknejad, Samuel Martin, 2012, Proceedings of the IEEE 2012 Custom Integrated Circuits Conference.

Recovery modeling of negative bias temperature instability (NBTI) for SPICE-compatible circuit aging simulators

Min Chen, Haldun Kufluoglu, Vijay Reddy, 2014, JETC.