Tsuyoshi Iwagaki
发表
Hideo Fujiwara,
Tsuyoshi Iwagaki,
Satoshi Ohtake,
2003,
2003 Test Symposium.
Hideo Fujiwara,
Tsuyoshi Iwagaki,
Satoshi Ohtake,
2006,
2006 IFIP International Conference on Very Large Scale Integration.
Tsuyoshi Iwagaki,
Mineo Kaneko,
2010,
2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications.
Hideo Fujiwara,
Tsuyoshi Iwagaki,
Michiko Inoue,
2006,
IEICE Trans. Inf. Syst..
Tsuyoshi Iwagaki,
Tomoo Inoue,
Hideyuki Ichihara,
2019,
2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).
Tsuyoshi Iwagaki,
2004
.
Tsuyoshi Iwagaki,
Tomoo Inoue,
Hideyuki Ichihara,
2017,
2017 International Test Conference in Asia (ITC-Asia).
Tsuyoshi Iwagaki,
Tomoo Inoue,
Hideyuki Ichihara,
2015,
2015 20th IEEE European Test Symposium (ETS).
Tsuyoshi Iwagaki,
Satoshi Ohtake,
Mineo Kaneko,
2007,
ICCAD 2007.
Tsuyoshi Iwagaki,
Mineo Kaneko,
Eiri Takeda,
2011,
IEICE Trans. Fundam. Electron. Commun. Comput. Sci..
Hideo Fujiwara,
Tsuyoshi Iwagaki,
Michiko Inoue,
2005,
14th Asian Test Symposium (ATS'05).
Tsuyoshi Iwagaki,
Hideyuki Ichihara,
Tomoo Inoue,
2020,
IEICE Trans. Fundam. Electron. Commun. Comput. Sci..
Tsuyoshi Iwagaki,
Mineo Kaneko,
2008
.
Hideo Fujiwara,
Tsuyoshi Iwagaki,
Satoshi Ohtake,
2004,
Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004..
Tsuyoshi Iwagaki,
Tomoo Inoue,
Hideyuki Ichihara,
2015,
2015 33rd IEEE International Conference on Computer Design (ICCD).
Keisuke Inoue,
Tsuyoshi Iwagaki,
Mineo Kaneko,
2009,
IEICE Trans. Fundam. Electron. Commun. Comput. Sci..
Yuki Fukazawa,
Tsuyoshi Iwagaki,
Tomoo Inoue,
2013,
2013 22nd Asian Test Symposium.
Tsuyoshi Iwagaki,
Tomoo Inoue,
Hideyuki Ichihara,
2019,
2019 IEEE International Test Conference in Asia (ITC-Asia).
Tsuyoshi Iwagaki,
Tomoo Inoue,
Hideyuki Ichihara,
2012,
2012 IEEE Asia Pacific Conference on Circuits and Systems.
Keisuke Inoue,
Tsuyoshi Iwagaki,
Mineo Kaneko,
2011,
IEICE Trans. Fundam. Electron. Commun. Comput. Sci..
Keisuke Inoue,
Tsuyoshi Iwagaki,
Mineo Kaneko,
2008,
2008 IEEE International Conference on Computer Design.
Tsuyoshi Iwagaki,
Satoshi Ohtake,
Hideo Fujiwara,
2003
.
Tsuyoshi Iwagaki,
Tomoo Inoue,
Hideyuki Ichihara,
2014,
2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).
Hideo Fujiwara,
Tsuyoshi Iwagaki,
Satoshi Ohtake,
2007,
2007 IEEE/ACM International Conference on Computer-Aided Design.
Hideo Fujiwara,
Tsuyoshi Iwagaki,
Satoshi Ohtake,
2005,
European Test Symposium (ETS'05).
Tsuyoshi Iwagaki,
Tomoo Inoue,
Hideyuki Ichihara,
2015,
2015 20th IEEE European Test Symposium (ETS).
Tsuyoshi Iwagaki,
Mineo Kaneko,
2009
.
Tsuyoshi Iwagaki,
Tomoo Inoue,
Hideyuki Ichihara,
2019,
IEEE Transactions on Emerging Topics in Computing.
Keisuke Inoue,
Tsuyoshi Iwagaki,
Mineo Kaneko,
2009,
GLSVLSI '09.
Keisuke Inoue,
Tsuyoshi Iwagaki,
Mineo Kaneko,
2008,
IEICE Trans. Fundam. Electron. Commun. Comput. Sci..
Kewal K. Saluja,
Tsuyoshi Iwagaki,
2011,
14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems.
Hideo Fujiwara,
Tsuyoshi Iwagaki,
Satoshi Ohtake,
2006,
VLSI-SoC.
Keisuke Inoue,
Tsuyoshi Iwagaki,
Mineo Kaneko,
2008
.
Tsuyoshi Iwagaki,
Tomoo Inoue,
Hideyuki Ichihara,
2012,
2012 IEEE 30th International Conference on Computer Design (ICCD).
A Test Generation Framework using Checker Circuits and its Application to Path Delay Test Generation
Tsuyoshi Iwagaki,
Satoshi Ohtake,
Mineo Kaneko,
2007
.
Tsuyoshi Iwagaki,
Tomoo Inoue,
Hideyuki Ichihara,
2014,
2014 IEEE 32nd International Conference on Computer Design (ICCD).