Hyun-Goo Jeon

Electromagnetic interference (EMI) behavior of system in package ( SIP)

Jongwoo Park, Seung-Bae Lee, Sang-Jun Hong, 2004, 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559).

Reliability of Pb-free preplated leadframe under atmosphere and accelerated aging test

Jongwoo Park, Hyun-Goo Jeon, Seung-Woo Lee, 2006 .