Y. Nakajima

Fabrication of NdBa2Cu3O7 − x interface-modified ramp-edge junctions by MOCVD

K. Tanabe, Y. Tarutani, S. Adachi, 2005 .

Surface Characterization in the Silicon Cleaning Process by a-UPC; Atmospheric Ultraviolet Photoelectron Counting

Kei Kinoshita, T. Tsunoda, Y. Nakajima, 1998 .