T. Hasegawa
发表
T. Okagaki,
T. Hasegawa,
H. Takashino,
2013,
2013 IEEE International Conference on Microelectronic Test Structures (ICMTS).
T. Hasegawa,
M. Paolucci,
K. Sycara,
2005,
IT Professional.
M. Koutani,
K. Kagoshima,
K. Sakuno,
2004,
2004 IEEE International Solid-State Circuits Conference (IEEE Cat. No.04CH37519).