A. Fujimura
发表
S. Shah,
H. Brut,
J.P. Schoellkopf,
2004,
Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516).
N.D. Arora,
K. Joshi,
K. Thumaty,
2005,
IEEE Transactions on Semiconductor Manufacturing.