R. Rosa

Characterization of titanium nitride films deposited onto silicon

P. Ostoja, A. Armigliato, G. Celotti, 1982 .

A NEW ELLIPSOMETRIC PROGRAMME APPLIED TO THE CHARACTERIZATION OF TRANSPARENT CONDUCTING TITANIUM NITRIDE FILMS

C. Summonte, G. Celotti, G. Martinelli, 1983 .

Characterization of TiOx films and their application as antireflection coatings for silicon solar cells

P. Ostoja, A. Armigliato, G. Celotti, 1981 .

Characterization of asymmetric fragmentation patterns in SFM images of porous silicon

I. Pepe, E. Veje, A. Silva, 2000 .