S. Hänström

Development of a standard method for quantitative depth profile analysis of zinc‐based metallic coatings by direct current glow discharge optical emission spectroscopy

A. Bengtson, N. Zacchetti, H. Hocquaux, 1999 .

Emission yield for quantitative depth profile analysis by glow discharge optical emission : the influence of discharge parameters

A. Bengtson, S. Hänström, 1998 .