Y. Weber

In-depth investigation of metallization aging in power MOSFETs

R. Ruffilli, Mounira Berkani, Philippe Dupuy, 2015, Microelectron. Reliab..

Mechanisms of power module source metal degradation during electro-thermal aging

R. Ruffilli, Mounira Berkani, Philippe Dupuy, 2017, Microelectron. Reliab..

Switching performance of 65 V vertical N-channel FLYMOSFETs

Karine Isoird, Yann Weber, Jean-Michel Reynes, 2008, Microelectron. J..

Aluminum metallization and wire bonding aging in power MOSFET modules

Mounira Berkani, Philippe Dupuy, Stéphane Lefebvre, 2018 .