J. K. Kibarian

Diagnostic system for IC manufacturing

A. J. Strojwas, J. K. Kibarian, 1991, [1991 Proceedings] IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop.

Analysis Of The Controllability Of A Sub-Micron CMOS Process Using TCAD

J. K. Kibarian, D. A. Hanson, Hung Sheng Chen, 1994, International Symposium on Semiconductor Manufacturing, Extended Abstracts of ISSM.

IC manufacturing diagnosis based on statistical analysis techniques

Andrzej J. Strojwas, J. K. Kibarian, 1991, [1991 Proceedings] Eleventh IEEE/CHMT International Electronics Manufacturing Technology Symposium.

Analysis of mixed-signal manufacturability with statistical technology CAD (TCAD)

M. Redford, J. K. Kibarian, D. A. Hanson, 1996 .

A TCAD Framework for Development and Manufacturing

Andrzej J. Strojwas, D.M.H. Walker, J. K. Kibarian, 1993 .

Analysis of mixed-signal manufacturability with statistical TCAD

M. Redford, J. K. Kibarian, D. A. Hanson, 1995, Proceedings of International Symposium on Semiconductor Manufacturing.

Using spatial information to analyze correlations between test structure data

J. K. Kibarian, A. J. Strojwas, 1990 .