Joseph Ya-min Lee

The characterization of retention properties of metal-ferroelectric (PbZr0.53Ti0.47O3)-insulator (Dy2O3, Y2O3)-semiconductor devices

Yu-Di Su, Wen-Chieh Shih, Joseph Ya-min Lee, 2007, Microelectron. Reliab..

An investigation of surface state capture cross-sections for metal-oxide-semiconductor field-effect transistors using HfO2 gate dielectrics

Fu-Chien Chiu, Huey-Liang Hwang, Wen-Chieh Shih, 2007, Microelectron. Reliab..

Hydrogen-induced transient effect in carbon-doped InGaP hetero-junction bipolar transistors

Joseph Ya-min Lee, Chang-Han Wu, Shao-You Deng, 2006, Microelectron. J..

Electrical characterization of metal-oxide-high-k dielectric-oxide-semiconductor (MOHOS) structures for memory applications

Joseph Ya-min Lee, Hsin-hao Hsu, 2007, Microelectron. Reliab..

Electrical conduction mechanism in high-dielectric-constant ZrO2 thin films

Joseph Ya-min Lee, Ming-Tsong Wang, Tsung-Hong Wang, 2005, Microelectron. Reliab..

Electrical properties of metal-HfO2-silicon system measured from metal-insulator-semiconductor capacitors and metal-insulator-semiconductor field-effect transistors using HfO2 gate dielectric

Fu-Chien Chiu, Joseph Ya-min Lee, Shun-An Lin, 2005, Microelectron. Reliab..

Advance in next century nano CMOSFET research and its future prospect for industry

Kuei-Shu Chang-Liao, C. C. Wang, Albert Chin, 2006 .

WPM 8.1 : A 8 x 8b Parallel Multiplier in Submicron Technology

Joseph Ya-min Lee, Charles W. Slayman, Hugh L. Garvin, 1984 .