S. Illyes

Charge loss associated with program disturb stresses in EPROMs

T. Miller, S. Illyes, D. A. Baglee, 1990, 28th Annual Proceedings on Reliability Physics Symposium.

Statistical bin limits: an approach to wafer dispositioning in IC fabrication

S. Illyes, D. Baglee, 1990, IEEE/SEMI Conference on Advanced Semiconductor Manufacturing Workshop.

Statistical bin limits-an approach to wafer disposition in IC fabrication

S. Illyes, D.A.G. Baglee, 1992 .