I. Kazymyra

How to increase ICs design productivity: one of the approaches

M. Blyzniuk, I. Kazymyra, 2002, Modern Problems of Radio Engineering, Telecommunications and Computer Science (IEEE Cat. No.02EX542).

FIESTA-EXTRA: cell-oriented software for the defect/fault analysis in VLSI circuits

I. Kazymyra, A. Blyzniuk, 2004, 2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716).

Models of ICs schematic vulnerability to local temperatures: development and analysis

M. Blyzniuk, I. Kazymyra, I. Farmaga, 2001, Experience of Designing and Applications of CAD Systems in Microelectronics. Proceedings of the VI-th International Conference. CADSM 2001 (IEEE Cat. No.01 EX473).

Estimation of parametric sensitivity for defects size distribution in VLSI defect/fault analysis

M. Blyzniuk, I. Kazymyra, 2002, 2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595).

IC schematic vulnerability to the temperature field distribution: Pre-layout estimation

M. Blyzniuk, I. Kazymyra, 2004, 2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716).

The use of IC simplified models in solving multiple criterion parametric optimization problems

I. Kazymyra, 2001, Experience of Designing and Applications of CAD Systems in Microelectronics. Proceedings of the VI-th International Conference. CADSM 2001 (IEEE Cat. No.01 EX473).

Terms of application of ICs factorial models in optimal design procedures

I. Kazymyra, O. Kruk, Y. Sanotskyi, 2004, Proceedings of the International Conference Modern Problems of Radio Engineering, Telecommunications and Computer Science, 2004..