Ji Deng

Phase extraction in digital speckle pattern interferometry using variational mode decomposition and high-order ambiguity function

Hui Zhang, Qiyang Xiao, Hao Feng, 2019, 2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC).

Efficient intensity-based fringe projection profilometry method resistant to global illumination.

Hao Feng, Zhoumo Zeng, Jian Li, 2020, Optics express.