V. Goubier

Scan-based ATPG diagnostic and optical techniques combination: A new approach to improve accuracy of defect isolation in functional logic failure

P. Perdu, V. Pouget, D. Lewis, 2008, 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits.

Improving defect localization techniques with laser beam with specific analysis and set-up modules

D. Lewis, V. Pouget, G. Haller, 2012, 2012 IEEE International Reliability Physics Symposium (IRPS).

Characterization and TCAD simulation of 90 nm technology transistors under continous photoelectric laser stimulation for failure analysis improvement

D. Lewis, V. Pouget, A. Sarafianos, 2012, 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.

Best test pattern failure analysis flow for functional logic failure localization by IR-OBIRCH technique

P. Perdu, D. Lewis, V. Pouget, 2009, 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.

Intrinsic and extrinsic variables controlling the productivity of asexual populations of Nais spp, (Naididae, Oligochaeta)

V. Goubier, J. Juget, D. Barthélémy, 2004, Hydrobiologia.