Mirko Lohmann

Microscopic Parameters to Describe Homogeneity of Alkaline Texture on Si-wafers

E. Wefringhaus, Mirko Lohmann, 2013 .

Detailed Analysis of Random Pyramid Surfaces With Ray Tracing and Image Processing

Mirko Lohmann, Pietro P. Altermatt, Hendrik Holst, 2016, IEEE Journal of Photovoltaics.