Thomas W. Sloan

Simultaneous determination of production and maintenance schedules using in‐line equipment condition and yield information

Thomas W. Sloan, T. Sloan, 2008 .

Using in-line equipment condition and yield information for maintenance scheduling and dispatching in semiconductor wafer fabs

J. George Shanthikumar, Thomas W. Sloan, J. Shanthikumar, 2002 .

COMBINED PRODUCTION AND MAINTENANCE SCHEDULING FOR A MULTIPLE‐PRODUCT, SINGLE‐ MACHINE PRODUCTION SYSTEM

J. George Shanthikumar, Thomas W. Sloan, J. Shanthikumar, 2009 .

Data reduction techniques and hypothesis testing for analysis of benchmarking data

Jackson A. Nickerson, Thomas W. Sloan, J. Nickerson, 1999 .