Godfrey D

Self-Heating Analysis of GaN-HEMT for Various Ambient Temperature and Substrate Thickness

Subhash Chander, D. Nirmal, Arivazhagan L, 2020, 2020 5th International Conference on Devices, Circuits and Systems (ICDCS).

Investigation of AlGaN/GaN HEMT Breakdown analysis with Source field plate length for High power applications

Arivazhagan L, Godfrey D, D Nirmal, 2020, 2020 5th International Conference on Devices, Circuits and Systems (ICDCS).