S. Jakschik
发表
Rainer Duschl,
M. Kerber,
A. Avellan,
2007,
Microelectron. Reliab..
R. Degraeve,
M. Kerber,
S. Jakschik,
2007,
IEEE Transactions on Device and Materials Reliability.
M. Goldbach,
S. Jakschik,
M. Gutsche,
2002,
2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303).
S. Jakschik,
A. Avellan,
U. Schroeder,
2004,
IEEE Transactions on Electron Devices.
H. Reisinger,
S. Jakschik,
M. Gutsche,
2001,
International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).
Matty Caymax,
Matthias Bauer,
Peter Verheyen,
2007
.
S. Van Elshocht,
A. Akheyar,
S. Biesemans,
2008,
IEEE Electron Device Letters.
S. Jakschik,
E. Meusel,
F. Feustel,
2001,
2001 Proceedings. 51st Electronic Components and Technology Conference (Cat. No.01CH37220).
H. Reisinger,
M. Kerber,
S. Jakschik,
2002,
Digest. International Electron Devices Meeting,.
S. Jakschik,
S. Jakschik,
U. Schröder,
2004
.