C. K. Wang

Yield improvement through cycle time and process fluctuation analyses

Wen-Chi Chang, M. Yu, R. Wu, 2001, 2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings (Cat. No.01CH37203).

The management of innovation: strategy, structure, and organizational climate

C. K. Wang, S. D. Saleh, C. Wang, 1993 .