Eileen Jozefov

Statistical Correlation Between Optical Linewidth Measurement Systems With Variance Components Analysis

Eileen Jozefov, Paul Mullenix, Wayne Ruch, 1989, Advanced Lithography.

Pattern Verification Through Die-To-Database Inspection

Eileen Jozefov, Wayne Ruch, 1987, Advanced Lithography.

Die-To-Database Inspection - An Effective Method Of Detecting And Locating Defects On Reticles

Eileen Jozefov, Wayne Ruch, Steve Follis, 1986, Advanced Lithography.