Jeffrey Lam

发表

Key Issues for Implementing Smart Polishing in Semiconductor Failure Analysis

Yamin Huang, Zhihong Mai, Lei Zhu, 2017 .

Advanced soft fail characterization methodology for sub-28nm nanoscale SRAM yield improvement

Jianhua Yin, Xuemei Liu, Sherwin Fernandes, 2014, 25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2014).

Optimization of an Artificial Neural Network System for the Prediction of Failure Analysis Success

Hao Hu, Lin Zhao, S. H. Goh, 2019, Microelectronics Reliability.

Preserving Useful Info While Reducing Noise of Physiological Signals by Using Wavelet Analysis

Jeffrey Lam, 2011 .