Philippe Roche

发表

Design and performance parameters of an ultra-low voltage, single supply 32bit processor implemented in 28nm FDSOI technology

Robin Wilson, Arnaud Virazel, Alberto Bosio, 2015, Sixteenth International Symposium on Quality Electronic Design.

0.42-to-1.20V read assist circuit for SRAMs in CMOS 65nm

Bertrand Pelloux-Prayer, Sylvain Clerc, Fady Abouzeid, 2013, 2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S).

Usefulness and effectiveness of HW and SW protection mechanisms in a processor-based system

Régis Leveugle, Philippe Roche, Michele Portolan, 2008, 2008 15th IEEE International Conference on Electronics, Circuits and Systems.

Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level

Philippe Roche, Jean-Luc Autran, Daniela Munteanu, 2010, Microelectron. Reliab..

CovaDOTS: In Silico Chemistry-Driven Tool to Design Covalent Inhibitors Using a Linking Strategy

Dragos Horvath, Alexandre Varnek, Philippe Roche, 2019, J. Chem. Inf. Model..

Muons and thermal neutrons SEU characterization of 28nm UTBB FD-SOI and Bulk eSRAMs

Philippe Roche, Dimitri Soussan, Jean-Luc Autran, 2015, 2015 IEEE International Reliability Physics Symposium.

Scalable 0.35V to 1.2V SRAM bitcell design from 65nm CMOS to 28nm FDSOI

Kaya Can Akyel, Sylvain Clerc, Fady Abouzeid, 2013, 2013 Proceedings of the ESSCIRC (ESSCIRC).

2P2Idb v2: update of a structural database dedicated to orthosteric modulation of protein–protein interactions

Philippe Roche, Xavier Morelli, Marie Jeanne Basse, 2016, Database J. Biol. Databases Curation.

An approach to reduce computational cost in combinatorial logic netlist reliability analysis using circuit clustering and conditional probabilities

Lirida A. B. Naviner, Jean-Marc Daveau, Philippe Roche, 2011, 2011 IEEE 17th International On-Line Testing Symposium.

New D-Flip-Flop Design in 65 nm CMOS for Improved SEU and Low Power Overhead at System Level

Sylvain Clerc, Philippe Roche, Gilles Gasiot, 2013, IEEE Transactions on Nuclear Science.

ASTEP (2005-2015): Ten years of soft error and atmospheric radiation characterization on the Plateau de Bure

Philippe Roche, Jean-Luc Autran, Daniela Munteanu, 2015, Microelectron. Reliab..

Single event upset and multiple cell upset modeling in commercial bulk 65 nm CMOS SRAMs and flip-flops

Philippe Roche, Gilles Gasiot, Jean-Luc Autran, 2009, 2009 European Conference on Radiation and Its Effects on Components and Systems.

Handling reconvergent paths using conditional probabilities in combinatorial logic netlist reliability estimation

Lirida A. B. Naviner, Jean-Marc Daveau, Philippe Roche, 2010, 2010 17th IEEE International Conference on Electronics, Circuits and Systems.

Reduced Instrumentation and Optimized Fault Injection Control for Dependability Analysis

Régis Leveugle, Philippe Roche, Pierre Vanhauwaert, 2006, 2006 IFIP International Conference on Very Large Scale Integration.

A 0.40pJ/cycle 981 μm2 voltage scalable digital frequency generator for SoC clocking

Sylvain Clerc, Fady Abouzeid, Philippe Roche, 2017, 2017 IEEE Asian Solid-State Circuits Conference (A-SSCC).

SEE test and modeling results on 45nm SRAMs with different well strategies

Philippe Roche, Gilles Gasiot, Slawosz Uznanski, 2010, 2010 IEEE International Reliability Physics Symposium.

Technology downscaling worsening radiation effects in bulk: SOI to the rescue

Philippe Roche, Daniela Munteanu, Gilles Gasiot, 2013, 2013 IEEE International Electron Devices Meeting.

Experimental model of adaptive body biasing for energy efficiency in 28nm UTBB FD-SOI

Dennis Sylvester, Bertrand Pelloux-Prayer, Sylvain Clerc, 2014, 2014 SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S).

A 460MHz at 397mV, 2.6GHz at 1.3V, 32b VLIW DSP, embedding FMAX tracking

Olivier Billoint, Christian Bernard, Fabien Clermidy, 2014, 2014 IEEE International Solid-State Circuits Conference Digest of Technical Papers (ISSCC).

65 nm fault tolerant latch architecture based on transient propagation blocking

Sylvain Clerc, Philippe Roche, Gilles Gasiot, 2014, 2014 IEEE International Reliability Physics Symposium.

30% static power improvement on ARM Cortex®-A53 using static biasing-anticipation

Sylvain Clerc, Fady Abouzeid, Jean-Marc Daveau, 2016, ESSCIRC Conference 2016: 42nd European Solid-State Circuits Conference.

TID and SEE Characterization of Rad-Hardened 1.2GHz PLL IP from New ST CMOS 65nm Space Technology

Philippe Roche, Florence Malou, Gilles Gasiot, 2014, 2014 IEEE Radiation Effects Data Workshop (REDW).

Focused chemical libraries--design and enrichment: an example of protein-protein interaction chemical space.

Philippe Roche, Xu Zhang, Xavier Morelli, 2014, Future medicinal chemistry.

30% static power improvement on ARM Cortex®-A53 using static Biasing-Anticipation

Sylvain Clerc, Fady Abouzeid, Jean-Marc Daveau, 2016, 2016 46th European Solid-State Device Research Conference (ESSDERC).

Growing Interest of Advanced Commercial CMOS Technologies for Space and Medical Applications. Illustration with a New Nano-Power and Radiation-Hardened SRAM in 130nm CMOS

Jean-Marc Daveau, Philippe Roche, Gilles Gasiot, 2008, 2008 14th IEEE International On-Line Testing Symposium.

Method for managing the operation of a redundant circuit and device combines majority voting

Sylvain Clerc, Jean-Marc Daveau, Philippe Roche, 2014 .

Atomic Analysis of Protein-Protein Interfaces with Known Inhibitors: The 2P2I Database

Philippe Roche, Xavier Morelli, Raphaël Bourgeas, 2010, PloS one.

A 240mV 1MHz, 340mV 10MHz, 40nm CMOS, 252 bits frame decoder using ultra-low voltage circuit design platform

Rajesh Kumar, Sylvain Clerc, Fady Abouzeid, 2011, 2011 18th IEEE International Conference on Electronics, Circuits, and Systems.

Verification of soft error detection mechanism through fault injection on hardware emulation platform

Umberto Rossi, Jean-Marc Daveau, Philippe Roche, 2010, 2010 International Conference on Dependable Systems and Networks Workshops (DSN-W).

Q-Learning-based Adaptive Power Management for IoT System-on-Chips with Embedded Power States

Fady Abouzeid, Philippe Roche, Jean-Luc Autran, 2018, 2018 IEEE International Symposium on Circuits and Systems (ISCAS).

Alpha soft error rate of FDSOI 28 nm SRAMs: Experimental testing and simulation analysis

Philippe Roche, Dimitri Soussan, Jean-Luc Autran, 2015, 2015 IEEE International Reliability Physics Symposium.

A method of managing the operation of a redundant majority decision circuit and associated apparatus

Sylvain Clerc, Jean-Marc Daveau, Philippe Roche, 2015 .

Fast reliability analysis of combinatorial logic circuits using conditional probabilities

Lirida A. B. Naviner, Jean-Marc Daveau, Philippe Roche, 2010, Microelectron. Reliab..

Factors that impact the critical charge of memory elements

Philippe Roche, Tino Heijmen, Damien Giot, 2006, 12th IEEE International On-Line Testing Symposium (IOLTS'06).

A 28nm FD-SOI standard cell 0.6–1.2V open-loop frequency multiplier for low power SoC clocking

Sylvain Clerc, Philippe Roche, Pierre Schamberger, 2016, 2016 IEEE International Symposium on Circuits and Systems (ISCAS).

Detailed SET Measurement and Characterization of a 65 nm Bulk Technology

Adrian Evans, Dan Alexandrescu, Sylvain Clerc, 2017, IEEE Transactions on Nuclear Science.

A 2.7pJ/cycle 16MHz SoC with 4.3nW power-off ARM Cortex-M0+ core in 28nm FD-SOI

Fady Abouzeid, Jean-Marc Daveau, Philippe Roche, 2017, ESSCIRC 2017 - 43rd IEEE European Solid State Circuits Conference.

Paving the way towards autonomous driving — Tackling soft errors to security challenges

Philippe Roche, Martin Duncan, 2017, 2017 IEEE International Reliability Physics Symposium (IRPS).

On-Orbit Upset Rate Prediction at Advanced Technology Nodes: a 28 nm FD-SOI Case Study

Philippe Roche, Dimitri Soussan, Gilles Gasiot, 2017, IEEE Transactions on Nuclear Science.

A 65nm SRAM achieving 250mV retention and 350mV, 1MHz, 55fJ/bit access energy, with bit-interleaved radiation Soft Error tolerance

Sylvain Clerc, Fady Abouzeid, Philippe Roche, 2012, 2012 Proceedings of the ESSCIRC (ESSCIRC).

Chemical and structural lessons from recent successes in protein-protein interaction inhibition (2P2I).

Philippe Roche, Xavier Morelli, Raphaël Bourgeas, 2011, Current opinion in chemical biology.

2P2IHUNTER: a tool for filtering orthosteric protein–protein interaction modulators via a dedicated support vector machine

Philippe Roche, Xavier Morelli, Marie Jeanne Basse, 2014, Journal of The Royal Society Interface.

Altitude SEE Test European Platform (ASTEP): Project Overview, First Results in CMOS 130nm and Perspectives

Philippe Roche, Jean-Luc Autran, Daniela Munteanu, 2006 .

Particle Monte Carlo modeling of single-event transient current and charge collection in integrated circuits

Sylvain Clerc, Philippe Roche, Jean-Luc Autran, 2014, Microelectron. Reliab..

On-chip supply power measurement and waveform reconstruction in a 28nm FD-SOI processor SoC

Borivoje Nikolic, Sylvain Clerc, Philippe Roche, 2016, 2016 IEEE Asian Solid-State Circuits Conference (A-SSCC).

Multi-Poisson process analysis of real-time soft-error rate measurements in bulk 65 nm and 40 nm SRAMs

Philippe Roche, Jean-Luc Autran, Daniela Munteanu, 2017, Microelectron. Reliab..

A Radiation Hardened Nano-Power 8Mb SRAM in 130nm CMOS

John Russell, Philippe Roche, David McClure, 2008, 9th International Symposium on Quality Electronic Design (isqed 2008).

A 0.32V, 55fJ per bit access energy, CMOS 65nm bit-interleaved SRAM with radiation Soft Error tolerance

Sylvain Clerc, Fady Abouzeid, Philippe Roche, 2012, 2012 IEEE International Conference on IC Design & Technology.

8.4 A 0.33V/-40°C process/temperature closed-loop compensation SoC embedding all-digital clock multiplier and DC-DC converter exploiting FDSOI 28nm back-gate biasing

David Bol, Julien De Vos, Dennis Sylvester, 2015, 2015 IEEE International Solid-State Circuits Conference - (ISSCC) Digest of Technical Papers.

A 2.7 pJ/cycle 16 MHz, 0.7 $\mu\text{W}$ Deep Sleep Power ARM Cortex-M0+ Core SoC in 28 nm FD-SOI

Fady Abouzeid, Jean-Marc Daveau, Philippe Roche, 2018, IEEE Journal of Solid-State Circuits.

Scalable 0.35 V to 1.2 V SRAM Bitcell Design From 65 nm CMOS to 28 nm FDSOI

Robin Wilson, Kaya Can Akyel, Sylvain Clerc, 2014, IEEE Journal of Solid-State Circuits.

Frequency and voltage effects on SER on a 65nm Sparc-V8 microprocessor under radiation test

Lirida A. B. Naviner, Sylvain Clerc, Fady Abouzeid, 2015, 2015 IEEE International Reliability Physics Symposium.

An industrial fault injection platform for soft-error dependability analysis and hardening of complex system-on-a-chip

Jean-Marc Daveau, Philippe Roche, Gilles Gasiot, 2009, 2009 IEEE International Reliability Physics Symposium.

A Flexible SoPC-based Fault Injection Environment

Régis Leveugle, Philippe Roche, Pierre Vanhauwaert, 2006, 2006 IEEE Design and Diagnostics of Electronic Circuits and systems.

Real-time soft-error rate measurements: A review

Philippe Roche, Jean-Luc Autran, Daniela Munteanu, 2014, Microelectron. Reliab..

A 140 nW, 32.768 kHz, 1.9 ppm/°C Leakage-Based Digitally Relocked Clock Reference with 0.1 ppm Long-Term Stability in 28nm FD-SOI

Fady Abouzeid, Philippe Roche, Jean-Luc Autran, 2018, 2018 IEEE Asian Solid-State Circuits Conference (A-SSCC).

28nm FD-SOI technology and design platform for sub-10pJ/cycle and SER-immune 32bits processors

Sylvain Clerc, Fady Abouzeid, Jean-Marc Daveau, 2015, ESSCIRC Conference 2015 - 41st European Solid-State Circuits Conference (ESSCIRC).

machine interaction modulators via a dedicated support vector protein - : a tool for filtering orthosteric protein HUNTER 2P2I

Philippe Roche, Xavier Morelli, Véronique Hamon, 2013 .

2P2Idb: a structural database dedicated to orthosteric modulation of protein–protein interactions

Philippe Roche, Xavier Morelli, Raphaël Bourgeas, 2012, Nucleic Acids Res..

FIRECAP: Fail-Reason Capturing hardware module for a RISC-V based System on a Chip

Olivier Romain, Valérie Bertin, Fady Abouzeid, 2021, 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).

Automated Dysfunctional Model Extraction for Model Based Safety Assessment of Digital Systems

Giorgio Di Natale, Jean-Marc Daveau, Philippe Roche, 2021, 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS).

A commercial 65nm CMOS technology for space applications: Heavy ion, proton and gamma test results and modeling

Sylvain Clerc, Jean-Marc Daveau, Philippe Roche, 2009, 2009 European Conference on Radiation and Its Effects on Components and Systems.

Comparison of the sensitivity to heavy ions of 0.25-/spl mu/m bulk and SOI technologies

Philippe Roche, P. Flatresse, Gilles Gasiot, 2002 .

Soft-Error Rate of Advanced SRAM Memories: Modeling and Monte Carlo Simulation

Philippe Roche, Daniela Munteanu, Gilles Gasiot, 2012 .

SER/SEL performances of SRAMs in UTBB FDSOI28 and comparisons with PDSOI and BULK counterparts

Cyril Bottoni, Philippe Roche, Dimitri Soussan, 2014, 2014 IEEE International Reliability Physics Symposium.

A Commercial 65 nm CMOS Technology for Space Applications: Heavy Ion, Proton and Gamma Test Results and Modeling

Sylvain Clerc, Jean-Marc Daveau, Philippe Roche, 2010, IEEE Transactions on Nuclear Science.

Multicenter comparison of alpha particle measurements and methods typical of semiconductor processing

Philippe Roche, Michael Gordon, Brett M. Clark, 2011, 2011 International Reliability Physics Symposium.

A 1.1-pJ/cycle, 20-MHz, 0.42-V Temperature Compensated ARM Cortex-M0+ SoC With Adaptive Self Body-Biasing in FD-SOI

Fady Abouzeid, Jean-Marc Daveau, Philippe Roche, 2018, IEEE Solid-State Circuits Letters.

Experimental Soft Error Rate of Several Flip-Flop Designs Representative of Production Chip in 32 nm CMOS Technology

Sylvain Clerc, Fady Abouzeid, Philippe Roche, 2013, IEEE Transactions on Nuclear Science.

Investigating the single-event-transient sensitivity of 65 nm clock trees with heavy ion irradiation and Monte-Carlo simulation

Sylvain Clerc, Fady Abouzeid, Philippe Roche, 2016, 2016 IEEE International Reliability Physics Symposium (IRPS).

Real-time soft error rate measurements on bulk 40 nm SRAM memories: a five-year dual-site experiment

Philippe Roche, Daniela Munteanu, Gilles Gasiot, 2016 .