K. Fujita

发表

Hiroaki Yamada, Takashi Ohsawa, Hidemi Ishiuchi, 2003, 2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407).

Akihiro Nitayama, Ryo Fukuda, Takashi Ohsawa, 2009, IEEE Transactions on Electron Devices.

Akihiro Nitayama, Takashi Ohsawa, Takeshi Hamamoto, 2004, Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004..

Hiroaki Yamada, Takashi Ohsawa, Takeshi Hamamoto, 2003, 2003 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.03CH37408).

Atsushi Sakamoto, Akihiro Nitayama, Takashi Ohsawa, 2006, 2006 IEEE International Conference on IC Design and Technology.

Masashi Yamaguchi, Xiaohua Li, Masahiro Kurata, 2013, Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring.

Akihiro Nitayama, Ryo Fukuda, Takashi Ohsawa, 2008, 2008 IEEE International Electron Devices Meeting.

Masashi Yamaguchi, Masahiro Kurata, Xiaohua Li, 2013, Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring.

Akihiro Nitayama, Ryo Fukuda, Takashi Ohsawa, 2007, 2007 IEEE International Electron Devices Meeting.

Atsushi Sakamoto, Takashi Ohsawa, Takeshi Hamamoto, 2006, 2006 Symposium on VLSI Circuits, 2006. Digest of Technical Papers..

Atsushi Sakamoto, Akihiro Nitayama, Takashi Ohsawa, 2007, IEEE Transactions on Electron Devices.

Takashi Ohsawa, Shigeyoshi Watanabe, Takeshi Hamamoto, 2005, ISSCC. 2005 IEEE International Digest of Technical Papers. Solid-State Circuits Conference, 2005..

Atsushi Sakamoto, Akihiro Nitayama, Takashi Ohsawa, 2005, IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..