L. Sedláček

APPLICATION OF ELECTRON CHANNELING CONTRAST IMAGING IN STUDY OF POLYCRYSTALLINE MATERIALS AND VISUALIZATION OF CRYSTAL LATTICE DEFECTS

J. Man, J. Dluhoš, L. Sedláček, 2012 .

Future Prospects for Defect and Strain Analysis in the SEM via Electron Channeling

M. Graef, N. T. Nuhfer, Y. Picard, 2012, Microscopy Today.

High Spatial Resolution Time-of-Flight Secondary Ion Mass Spectrometry for the Masses: A Novel Orthogonal ToF FIB-SIMS Instrument with In Situ AFM

J. Michler, M. Bechelany, M. Gabureac, 2012 .

FIB‐SIMS quantification using TOF‐SIMS with Ar and Xe plasma sources

F. Stevie, E. Principe, J. Jiruše, 2014 .

The step towards an ultimate multifunctional tool for nanotechnology

B. Lencová, T. Šamořil, J. Jiruše, 2012, 2012 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO).

Combined SEM-FIB-SPM-TOF-EDX-EBSD as a Multifunctional Tool

V. Friedli, J. Jiruše, L. Sedláček, 2012, Microscopy and Microanalysis.