Anita A. Villanueva

Electrical reliability of RF power GaAs PHEMTs

Anita A. Villanueva, A. Villanueva, 2003 .

Corrosion-induced degradation of GaAs PHEMTs under operation in high humidity conditions

Kenji Hosogi, Hajime Sasaki, Naohito Yoshida, 2009, Microelectron. Reliab..

Electrical degradation mechanisms of RF power GaAs PHEMTs

Anita A. Villanueva, A. Villanueva, 2003, IEEE International Electron Devices Meeting 2003.

Simultaneous achievement of high performance and high reliability in a 38/77GHz InGaAs/AlGaAs PHEMT MMIC

Hajime Sasaki, Takayuki Kato, Naohito Yoshida, 2010, IEICE Electron. Express.