S. Yokozeki

X-ray diffraction study of lattice parameters for layered compounds MxTaS2 (M=Tl or In)

K. Ohshima, K. Yamamoto, T. Takeda, 1995 .

High resolution speckle interferometry by replacing temporal information with spatial information

T. Inoue, S. Yokozeki, Y. Arai, 2011, Optical Metrology.

Improvement of measurement accuracy in shadow moiré by considering the influence of harmonics in the moiré profile.

Y. Arai, S. Yokozeki, Y Arai, 1999, Applied optics.