K. Jackson

Detecting and addressing the surface following errors in the calibration of step heights by atomic force microscopy

J Haycocks, K Jackson, J. Haycocks, 2007 .

Combined optical and X–ray interferometry for high–precision dimensional metrology

J. Stümpel, A. Franks, M. Stedman, 2000, Proceedings of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences.

A parabolic mirror x-ray collimator

A. Yacoot, A. Franks, K. Jackson, 2000 .

Advances in traceable nanometrology at the National Physical Laboratory

Andrew Lewis, Richard K. Leach, J Haycocks, 2001 .

Traceable calibration of transfer standards for scanning probe microscopy

J Haycocks, K. Jackson, J. Haycocks, 2005 .

Automatic Gauge Block Measurement Using Multiple Wavelength Interferometry

D. J. Pugh, K. Jackson, K. Jackson, 1986, Other Conferences.