K Nakamae

Wafer Fabrication Process Simulation Including Cost: Which Should be Used in an In-Line Wafer Inspection Strategy, High Sensitivity and High Cost Inspection Machine or Low Sensitivity and Low Cost Inspection Machine?

H Fujioka, K Nakamae, S Yamaji, 2000 .

Automatic EB fault-tracing by successive circuit extraction from layout data

Katsuyoshi Miura, H Fujioka, K Nakamae, 2000 .

Fail Pattern Classification and Analysis System of Memory Fail Bit Maps

K Nakamae, H Fujioka, A Itoh, 1999 .

Rotation vector analysis of eye movement in three dimensions with an infrared CCD camera.

K Nakamae, H. Fujioka, K. Nakamae, 1999, Acta oto-laryngologica.