Erik W. Anthon

Ellipsometer With Adjustable Wavelength Capability (400 To 2000 Nm)

Erik W. Anthon, 1988, Photonics West - Lasers and Applications in Science and Engineering.

Miniature spectrometer based on linear variable interference filters

Erik W. Anthon, Paul G. Hannan, Lin Zhang, 1999, Optics East.

Automated precision reflectometer for first-surface mirrors I: optical head

Erik W. Anthon, Luis F. Villanueva, Craig Van Horn, 1990, Optics & Photonics.

Scatter Measurements Made With Ultraviolet Light

Erik W. Anthon, 1985, Photonics West - Lasers and Applications in Science and Engineering.

Ellipsometers For Spectral Scans Of Psi And Delta Using A Single Polarizing Element

Erik W. Anthon, 1990, Optics & Photonics.

An Instrument For Measurement Of Surface Scatter In The Presence Of Bulk Scatter

Erik W. Anthon, 1987, Optics & Photonics.

Automated precision reflectometer for first-surface mirrors II: system

Erik W. Anthon, Luis F. Villanueva, Craig Van Horn, 1990, Optics & Photonics.