M. Barré

A general methodology using an electron beam tester applied to failure localization inside a logic integrated circuit

François Marc, Hélène Fremont, Yves Danto, 1995 .

The limits of automatic systems for defect location using e-beam testing

François Marc, Yves Danto, P. Jounet, 1996 .

Mechanisms for space applications

M. Meftah, M. Barré, A. Irbah, 2012, Defense + Commercial Sensing.