N. Nemoto

Analysis of single-ion multiple-bit upset in high-density DRAMs

Sumio Matsuda, A. B. Campbell, N. Nemoto, 2000 .

A nondamaging beam blanking SEM test method and its application to highly integrated devices

S. Matsuda, S. Kuboyama, A. Makihara, 2001 .

The irradiation facilities for the radiation tolerance testing of semiconductor devices for space use in Japan

Kazuo Arakawa, Takeshi Ohshima, Sumio Matsuda, 1999, 1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463).

Evaluation of single-event upset tolerance on recent commercial memory ICS

Isamu Nashiyama, Sumio Matsuda, Hisayoshi Itoh, 1997 .

Radiation hardness of pseudomorphic HEMT and dual-gate GaAs MES-FET MMICs

Takuo Kashiwa, Sumio Matsuda, K. Yajima, 1997, RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294).