Shouhong Chen

发表

STUDY ON DE-EMBEDDING APPROACH OF NON-COAXIAL MICROWAVE DEVICE TEST FIXTURES

Jun Ma, Ping Yang, Shouhong Chen, 2018, 2018 19th International Conference on Electronic Packaging Technology (ICEPT).

Research on TSV Void Defects Based on Machine Learning

Jun Ma, Ling Guo, Shouhong Chen, 2019, CSAE 2019.

Research on Low-voltage Series Arc Fault Detection Method Based on Least Squares Support Vector Machine

Jianhong Yang, Kai Yang, Rencheng Zhang, 2015 .

A general boundary scan test system based on EDIF netlist file transfer to Protel netlist file

Zhuang Wang, Ping Yang, Shouhong Chen, 2016 .

Series Arc Fault Detection Algorithm Based on Autoregressive Bispectrum Analysis

Jianhong Yang, Kai Yang, Xingbin Zhang, 2015, Algorithms.

Detection of arc fault based on frequency constrained independent component analysis

Kai Yang, Rencheng Zhang, Jianhong Yang, 2015, Precision Engineering Measurements and Instrumentation.

Research on PZT multi-channel power supply and control method

Wei Fan, Shouhong Chen, Zhongshen Li, 2011, Proceedings of 2011 International Conference on Electronic & Mechanical Engineering and Information Technology.

2D-CWT IP core design and implementation for fringe pattern analysis

Hong Chen, Jun Ma, Yuanyuan Ma, 2019, IOP Conference Series: Materials Science and Engineering.

A Novel Arc Fault Detector for Early Detection of Electrical Fires

Jianhong Yang, Kai Yang, Rencheng Zhang, 2016, Sensors.

Parameter selection algorithm of DBSCAN based on K-means two classification algorithm

Zhao Shuang, Liu Xinyu, Jun Ma, 2019 .

Research on mixed type wafer map based on deep convolutional neural network

Jun Ma, Shouhong Chen, Mulan Yi, 2021, Other Conferences.

AI classification of wafer map defect patterns by using dual-channel convolutional neural network

Yuling Shang, Shouhong Chen, Mulan Yi, 2021, Engineering Failure Analysis.

A self-adaptive DBSCAN-based method for wafer bin map defect pattern classification

Yuling Shang, Shouhong Chen, Mulan Yi, 2021 .