K. T. Huang

Advanced 0.25-0.18 /spl mu/m fully-planarized 6-level-interconnect CMOS technology for foundry manufacturing

W. K. Yeh, T. Lin, C. Chen, 1998, 1998 Semiconductor Manufacturing Technology Workshop (Cat. No.98EX133).

Inspection of defects and metallic contamination in SiGe:B CMOS using an in-line photoluminescence monitor

Zhiqiang Li, S. F. Tzou, Tom Walker, 2006, SPIE LASE.

Nanocomposite CoPt-SiN x /Ag Films for High Density Magnetic Recording Media

C. T. Kuo, K. T. Huang, G. P. Lin, 2008 .

P‐107: The Fastest Response TN‐Type TFT LCD of the World Likes OCB Level

K. T. Huang, Andy Chao, C. W. Tsai, 2007 .

In-line implant and RTP process monitoring using the carrier illumination technique for 65 nm and beyond

S. F. Tzou, Chin-Cheng Chien, K. T. Huang, 2006, SPIE LASE.