M. Hein

Gorsky effect study of H and D diffusion in V and Ti at high H(D) concentrations

A. Bals, A. Privalov, H. Wipf, 2003 .

Application of X-ray fluorescence analysis with total-reflection (TXRF) in material science

H. Ortner, P. Hoffmann, K. H. Lieser, 1992 .

Analysis of thin layers by total-reflection X-ray fluorescence spectrometry

K. Lieser, P. Hoffmann, M. Hein, 1989 .

Examination of steel samples, provided as reference materials, by instrumental analyses

P. Hoffmann, R. Jährling, A. Kübler, 1992 .