Y. Karmakov

Interfaces in ALD very thin Al2O3/HfO2 stacks studied by ellipsometry

A. Paskaleva, D. Spassov, Y. Karmakov, 2023, Journal of Physics: Conference Series.

Interfacial layers in Ta2O5 based stacks and constituent depth profiles by spectroscopic ellipsometry

E. Atanassova, A. Paskaleva, Y. Karmakov, 2012 .

Effect of Sb in thick InGaAsSbN layers grown by liquid phase epitaxy

N. Ekins‐Daukes, A. Mellor, D. Alonso-Álvarez, 2018 .

Influence of Hf doping on interfacial layers of Ta2O5 stacks studied by ellipsometry

A. Paskaleva, Y. Karmakov, 2013 .