J. Becher

Analysis of Image Smear in CRT Displays Due to Scan Rate and Phosphor Persistence

C. E. Rash, Clarence E Rash, Jacob Becher, 1982 .

Ultraviolet converter transients induced by electrons.

C. Reft, J. Becher, R. L. Kernell, 1984, Applied optics.

Surface energy transfer enhanced by optical cavity excitation: a pole analysis

J. Becher, John E. Sipe, J. Sipe, 1982 .