T. Wöhner

发表

On the Role of Foreign Atoms in the Optimization of 3C-SiC/Si Heterointerfaces

J. Pezoldt, P. Masri, T. Stauden, 1999 .

Sputtering-induced surface roughness of polycrystalline Al films and its influence on AES depth profiles

G. Ecke, S. Hofmann, H. Rössler, 1998 .

Simulation of sputter-induced roughness for depth profiling of thin film structures

G. Ecke, S. Hofmann, H. Rössler, 1995, Analytical and bioanalytical chemistry.

The Diffusion Coefficient of Silicon in Thin SiC Layers as a Criterion for the Quality of the Grown Layers

J. Pezoldt, V. Cimalla, T. Wöhner, 2000 .

The Influence of Foreign Atoms on the early Stages of SiC Growth on (111)Si

György Vida, J. Pezoldt, J. Schaefer, 2000 .

In Situ Spectroscopic Ellipsometry Studies of The Interaction Process of Ethene With Si Surfaces During Sic Formation

J. Pezoldt, J. Schaefer, V. Cimalla, 1999 .

Real time spectroscopic ellipsometry monitoring of the SiC growth during the interaction process of elemental carbon with Si surfaces

J. Schaefer, V. Cimalla, T. Stauden, 2000 .

Optimization of 3C–SiC/Si heterointerfaces in epitaxial growth

J. Pezoldt, P. Masri, M. Avérous, 2000 .

Blister Formation in Film Insert Moulding

B. Whiteside, G. Tosello, A. Islam, 2020, Micromachines.

Influence of Process Temperatures on Blister Creation in Micro Film Insert Molding of a Dual Layer Membrane

B. Whiteside, G. Tosello, A. Islam, 2016 .

Mould Design and Material Selection for Film Insert Moulding of Direct Methanol Fuel Cell Packaging

G. Tosello, A. Islam, S. Senkbeil, 2015 .

Characterization method for blisters created in film insert moulding

G. Tosello, A. Islam, H. Hansen, 2015 .